A highly accurate method for measuring the ordinary and extraordinary refractive indices of liquid crystal materials

被引：0
|
作者：
Ohno, Y. [1 ]
Ishinabe, T. [1 ]
Miyashita, T. [1 ]
Uchida, T. [1 ]
机构：
[1] Tohoku Univ, Grad Sch Engn, Dept Elect, Aoba Ku, Sendai, Miyagi 9808579, Japan
来源：
IDW '07: PROCEEDINGS OF THE 14TH INTERNATIONAL DISPLAY WORKSHOPS, VOLS 1-3 | 2007年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A new method for measuring the ordinary and extraordinary refractive indices of liquid crystal materials was devised by considering multiple reflections and interference. The refractive indices can be obtained from the numerical fitting between measured values and calculated values of the amplitude ratios and phase differences. This method is effective for design of high-quality liquid crystal displays.
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页码：47 / 50
页数：4
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