Increased accuracy of absolute group delay measurements

被引：0
|
作者：
Le Truong, M [1 ]
机构：
[1] Hewlett Packard Co, Santa Rosa, CA USA
来源：
MICROWAVE JOURNAL | 1999年 / 42卷 / 09期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This two-step approach can reduce ripple and increase accuracy to +/- 150 ps when measuring absolute group delay of frequency-translation devices such as frequency converters.
引用
收藏
页码：150 / +
页数：6
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