Increased accuracy of absolute group delay measurements

被引：0

作者：

Le Truong, M ^{[1
]}

机构：

[1] Hewlett Packard Co, Santa Rosa, CA USA

来源：

MICROWAVE JOURNAL | 1999年 / 42卷 / 09期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This two-step approach can reduce ripple and increase accuracy to +/- 150 ps when measuring absolute group delay of frequency-translation devices such as frequency converters.

引用

页码：150 / +

页数：6

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