RESOLUTION AND STABILITY ANALYSIS IN FULL-APERTURE, LINEARIZED CONDUCTIVITY AND WAVE IMAGING

被引：0

作者：

Ammari, Habib ^{[1
]}

Garnier, Josselin ^{[2
,3
]}

Solna, Knut ^{[4
]}

机构：

[1] Ecole Normale Super, Dept Math & Applicat, F-75005 Paris, France

[2] Univ Paris 07, Lab Probabilites & Modeles Aleatoires, F-75205 Paris 13, France

[3] Univ Paris 07, Lab Jacques Louis Lions, F-75205 Paris 13, France

[4] Univ Calif Irvine, Dept Math, Irvine, CA 92697 USA

来源：

PROCEEDINGS OF THE AMERICAN MATHEMATICAL SOCIETY | 2013年 / 141卷 / 10期

关键词：

Inverse conductivity problem; wave imaging; resolution; stability; ELECTRICAL-IMPEDANCE TOMOGRAPHY; EXTENDED TARGETS; RESPONSE MATRIX; INVERSE PROBLEM;

D O I：

暂无

中图分类号：

O29 [应用数学];

学科分类号：

070104 ;

摘要：

In this paper we consider resolution estimates in both the linearized conductivity problem and the wave imaging problem. Our purpose is to provide explicit formulas for the resolving power of the measurements in the presence of measurement noise. We show that the low-frequency regime in wave imaging and the inverse conductivity problem are very sensitive to measurement noise, while high frequencies increase stability in wave imaging.

引用

页码：3431 / 3446

页数：16

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