EXAFS and XANES studies of silica-titania sol-gel films

被引：20

作者：

Almeida, RM ^{[1
]}

Marques, MID ^{[1
]}

Orignac, X ^{[1
]}

机构：

[1] UNIV LISBON,CTR FIS MAT CONDENSADA,P-1699 LISBON,PORTUGAL

来源：

JOURNAL OF SOL-GEL SCIENCE AND TECHNOLOGY | 1997年 / 8卷 / 1-3期

关键词：

SiO2-TiO2; films; EXAFS; XANES; synchrotron radiation; four-fold coordinated Ti; structure of sol-gel films;

D O I：

10.1007/BF02436854

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

A series of SiO2-TiO2 sol-gel films with and without heat treatment were analyzed by EXAFS and XANES spectroscopies. Both techniques indicate that essentially all Ti4+ ions remain four-fold coordinated, with a Ti-O bond distance between 1.82-1.85 Angstrom. In the glassy films produced by heat treatment at 900 degrees C, a gradual phase separation may occur at the nanoscale, as the TiO2 concentration of the films increases.

引用

页码：293 / 297

页数：5

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