Improvements in the determination of extinction coefficients of a thin film using an envelope method

被引：7
|
作者：
Kar, M [1 ]
Verma, BS [1 ]
机构：
[1] Natl Phys Lab, Div Elect Mat, New Delhi 110012, India
来源：
JOURNAL OF OPTICS A-PURE AND APPLIED OPTICS | 2005年 / 7卷 / 10期
关键词：
thin film; optical constants; refractive index; extinction coefficient; envelope method; variational method;
D O I：
10.1088/1464-4258/7/10/012
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The algorithm used in the envelope method has been integrated with a variational method, for accurate determination of the refractive index (it) and extinction coefficient (k) of a weakly absorbing film deposited onto a weakly absorbing thick substrate. The proposed algorithm leads to significant improvement in the degree of accuracy of k values in the medium and weak absorption region down to k similar to 5 x 10(-5).
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页码：599 / 603
页数：5
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