An Analysis of Scale Dependent and Quantum Effects on Electrical Contact Resistance between Rough Surfaces

被引:0
|
作者
Jackson, Robert L. [1 ]
Crandall, Erika R. [2 ]
Bozack, M. J. [2 ]
机构
[1] Auburn Univ, Dept Mech Engn, Auburn, AL 36849 USA
[2] Auburn Univ, Dept Phys, Auburn, AL USA
关键词
conductance quantization; rough surface contact; multiscale properties; contact resistance; asperity strength; CONSTRICTION RESISTANCE; MECHANICAL-PROPERTIES; POINT CONTACTS; CONDUCTANCE; GOLD; STRENGTH; SHARVIN; MODEL; SIZE;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The objective of this work is to evaluate the effect of scale dependent mechanical and electrical properties on electrical contact resistance (ECR) between rough surfaces. This work attempts to build on existing ECR models that neglect potentially important quantum- and size-dependent contact and electrical conduction mechanisms of the asperity sizes present on typical surfaces. The electrical conductance at small scales can quantize or show a stepping trend as the contact area is varied in the range of the free electron Fermi wavelength squared. This work then evaluates if these effects remain important for the interface between rough surfaces which may include many small scale contacts of varying sizes. The results suggest that these effects may not always be significant in some cases and macro-scale and continuum mechanics based models may be sufficient.
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页码:1 / 10
页数:10
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