Implications of the figure of merit in environmental SEM

被引:4
|
作者
Danilatos, Gerasimos D. [1 ]
机构
[1] ESEM Res Lab, Bondi Jct, NSW 2026, Australia
关键词
Figure of merit; Beam transfer in ESEM; Electron skirt; Critical ESEM issues; VP-ESEM; Stokes DJ; Variable pressure SEM; Environmental SEM; Environmental distance; BEAM TRANSFER;
D O I
10.1016/j.micron.2012.06.001
中图分类号
TH742 [显微镜];
学科分类号
摘要
A proper understanding of the behavior of gas flow in an environmental scanning electron microscope together with its interactions with the electron beam is important for work in this field. Further discussion on a figure of merit introduced recently is reported together with a critical review of some prior literature, with particular attention to issues found in error. A concise attempt is made to consolidate the relevant terminology in order to avoid further misinterpretations in this field. (c) 2012 Elsevier Ltd. All rights reserved.
引用
收藏
页码:143 / 149
页数:7
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