Assessment of the Nanohardness of a-SiC: H Film by Cyclic Nanoindentation

被引:0
|
作者
Tischler, Daniel [1 ]
Valova, Marie [1 ]
Stepanek, Ivo [2 ]
机构
[1] Czech Tech Univ, Fac Mech Engn, Prague 16706, Czech Republic
[2] Univ W Bohemia, Plzen 30114, Czech Republic
关键词
cyclic nanoindentation; a-SiC: H thin film; hexamethyldisiloxane; PECVD; SURFACE;
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Due to very little depth of indent, the cyclic nanoindentation test is used for nondestructive testing of thin films of amorphous hydrogenated silicon carbide (a-SiC: H). We prepared the films, containing various volumes of hexamethyldisiloxane (0.6 g/h and 1 g/h), onto stainless steel substrates by Plasma Enhanced Chemical Vapor Deposition technique. In this paper, the mechanical properties, especially nanohardness, are assessed by the cyclic nanoindentation test. We found out that higher volumes of vapors of Hexamethyldisiloxane cause increases in the nanohardness and thickness of the prepared film.
引用
收藏
页码:167 / 176
页数:10
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