Measurement of complex permittivity of solids up to 1000 degrees C

被引:0
|
作者
Hauschild, T [1 ]
Knochel, R [1 ]
机构
[1] TECH UNIV HAMBURG,ARBEITSBEREICH HOCHFREQUENZTECH,D-21071 HAMBURG,GERMANY
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:1687 / 1690
页数:4
相关论文
共 50 条
  • [21] Measurement of complex permittivity and complex permeability of materials
    Alenkowicz, H
    Levitas, B
    MIKON-98: 12TH INTERNATIONAL CONFERENCE ON MICROWAVES & RADAR, VOLS 1-4, 1998, : 668 - 672
  • [22] TEMPERATURE MEASUREMENT IN HIGH TEMPERATURE CHEMISTRY - 1000-3000 DEGREES C
    WALKER, RF
    REVUE INTERNATIONALE DES HAUTES TEMPERATURES ET DES REFRACTAIRES, 1966, 3 (03): : 301 - +
  • [23] MEASUREMENT OF THE THERMAL-DIFFUSIVITY OF MOLTEN KCL UP TO 1000-DEGREES-C BY THE FORCED RAYLEIGH-SCATTERING METHOD
    NAGASAKA, Y
    NAGASHIMA, A
    INTERNATIONAL JOURNAL OF THERMOPHYSICS, 1988, 9 (06) : 923 - 931
  • [24] COMPLEX PERMITTIVITY IN IONICALLY CONDUCTING SOLIDS - A HOPPING MODEL
    HENN, F
    ELLIOTT, SR
    GIUNTINI, JC
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 1991, 136 (1-2) : 60 - 66
  • [25] APPARATUS FOR MEASUREMENT OF THERMAL-EXPANSION OF SOLIDS FROM 25-DEGREES-C TO 1600-DEGREES-C IN AIR
    VALENTICH, J
    ISA TRANSACTIONS, 1977, 16 (02) : 81 - 89
  • [26] COMPLEX PERMITTIVITY MEASUREMENT OF OPTOELECTRONIC SUBSTRATES
    BOURREAU, D
    GUILLON, P
    CHATARDMOULIN, M
    ELECTRONICS LETTERS, 1986, 22 (07) : 399 - 400
  • [27] Measurement of Complex Permittivity in Free Space
    Skocik, Petr
    Neumann, Petr
    25TH DAAAM INTERNATIONAL SYMPOSIUM ON INTELLIGENT MANUFACTURING AND AUTOMATION, 2014, 2015, 100 : 100 - 104
  • [28] MICROWAVE MEASUREMENT OF COMPLEX PERMITTIVITY OF SEMICONDUCTORS
    GUNN, MW
    PROCEEDINGS OF THE IEEE, 1964, 52 (02) : 185 - &
  • [29] Measurement of Complex Permittivity of Biological Tissues
    Vorlicek, J.
    Oppl, L.
    Vrba, J.
    PIERS 2010 CAMBRIDGE: PROGRESS IN ELECTROMAGNETICS RESEARCH SYMPOSIUM PROCEEDINGS, VOLS 1 AND 2, 2010, : 599 - 601
  • [30] SIMPLE NONINVASIVE MEASUREMENT OF COMPLEX PERMITTIVITY
    JOHNSON, RH
    POTHECARY, NM
    ROBINSON, MP
    PREECE, AW
    RAILTON, CJ
    ELECTRONICS LETTERS, 1993, 29 (15) : 1360 - 1361