Characterization of Nanocrystalline Lead Sulphide Thin Films Prepared by Chemical Bath Deposition Technique

被引:17
|
作者
Hussain, A. [1 ]
Begum, A. [1 ]
Rahman, A. [1 ]
机构
[1] Gauhati Univ, Dept Phys, Gauhati 781014, Assam, India
来源
关键词
Thin film; Nanocrystalline; Semiconductor; XRD; X-ray fluorescence; CDS CRYSTALLITES; SIZE; NANOPARTICLES;
D O I
10.1007/s13369-012-0390-3
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Nanocrystalline PbS thin films were deposited on clean glass substrates by chemical bath deposition technique using lead acetate and thiourea as Pb2+ and S2- ions source, respectively. PbS films of five different molarities (0.05-0.150M) were prepared at pH (10.5 and 11) and deposition temperature (318 and 333 K). The structural characterization of the films was carried out by X-ray diffraction (XRD), X-ray fluorescence (XRF) and scanning electron microscopy (SEM).The structural parameters such as crystallite size, lattice constant, dislocation density and micro strain have been evaluated from the XRD spectra. The average crystallite sizes were found between 13 and 21 nm. XRF gave the presence of Pb and S in the prepared films. The surface morphology of the films was known from the SEM photographs.
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页码:169 / 174
页数:6
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