Far-Field Prediction from Amplitude-Only Near-Field Measurements Using Equivalent Electric Currents

被引：0

作者：

Zhao, Wei-Jiang ^{[1
]}

Park, Hark Byeong ^{[2
]}

Tan, Mark ^{[1
]}

Park, Hyun Ho ^{[2
]}

Liu, En-Xiao ^{[1
]}

Song, Eakhwan ^{[2
]}

Li, Er-Ping ^{[1
]}

机构：

[1] Inst High Performance Comp, Elect & Photon Dept, 1 Fusionopolis Way,16-16 Connexis, Singapore 138632, Singapore

[2] Samsung Elect, Gyeonggi 443742, South Korea

来源：

2012 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC) | 2012年

关键词：

SOURCE RECONSTRUCTION; TRANSFORMATION; OPTIMIZATION;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A general and flexible approach is presented for predicting far-field radiated emissions from a device using phaseless magnetic near-field scan data, which is based on the replacement of the actual radiating sources by an equivalent set of electric currents over a planar surface near the device. These equivalent currents used to predict the far-field radiated emissions are determined from near-field scan data by solving two independent nonlinear inverse problems with a global optimization algorithm. Numerical examples are presented to demonstrate the validity and capability of the presented approach.

引用

页码：750 / 753

页数：4

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