Far-Field Prediction from Amplitude-Only Near-Field Measurements Using Equivalent Electric Currents

被引：0
|
作者：
Zhao, Wei-Jiang [1 ]
Park, Hark Byeong [2 ]
Tan, Mark [1 ]
Park, Hyun Ho [2 ]
Liu, En-Xiao [1 ]
Song, Eakhwan [2 ]
Li, Er-Ping [1 ]
机构：
[1] Inst High Performance Comp, Elect & Photon Dept, 1 Fusionopolis Way,16-16 Connexis, Singapore 138632, Singapore
[2] Samsung Elect, Gyeonggi 443742, South Korea
来源：
2012 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC) | 2012年
关键词：
SOURCE RECONSTRUCTION; TRANSFORMATION; OPTIMIZATION;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A general and flexible approach is presented for predicting far-field radiated emissions from a device using phaseless magnetic near-field scan data, which is based on the replacement of the actual radiating sources by an equivalent set of electric currents over a planar surface near the device. These equivalent currents used to predict the far-field radiated emissions are determined from near-field scan data by solving two independent nonlinear inverse problems with a global optimization algorithm. Numerical examples are presented to demonstrate the validity and capability of the presented approach.
引用
收藏
页码：750 / 753
页数：4
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