A novel test generation approach for parametric faults in linear analog circuits

被引：18
|
作者：
Zheng, HH [1 ]
Balivada, A [1 ]
Abraham, JA [1 ]
机构：
[1] UNIV TEXAS,COMP ENGN RES CTR,AUSTIN,TX 78712
来源：
14TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS | 1996年
关键词：
D O I：
10.1109/VTEST.1996.510895
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：470 / 475
页数：6
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