Double injection in graphene p-i-n structures

被引:28
|
作者
Ryzhii, V. [1 ]
Semenikhin, I. [2 ]
Ryzhii, M. [3 ]
Svintsov, D. [2 ]
Vyurkov, V. [2 ]
Satou, A. [1 ]
Otsuji, T. [1 ]
机构
[1] Tohoku Univ, Elect Commun Res Inst, Sendai, Miyagi 9808577, Japan
[2] Russian Acad Sci, Inst Phys & Technol, Moscow 117218, Russia
[3] Univ Aizu, Dept Comp Sci & Engn, Aizu Wakamatsu, Fukushima 9658580, Japan
基金
日本科学技术振兴机构;
关键词
JUNCTION; PHOTODETECTORS; PHOTOCURRENT;
D O I
10.1063/1.4812494
中图分类号
O59 [应用物理学];
学科分类号
摘要
We study the processes of the electron and hole injection (double injection) into the i-region of graphene-layer and multiple graphene-layer p-i-n structures at the forward bias voltages. The hydrodynamic equations governing the electron and hole transport in graphene coupled with the two-dimensional Poisson equation are employed. Using analytical and numerical solutions of the equations of the model, we calculate the band edge profile, the spatial distributions of the quasi-Fermi energies, carrier density and velocity, and the current-voltage characteristics. In particular, we demonstrated that the electron and hole collisions can strongly affect these distributions. The obtained results can be used for the realization and optimization of graphene-based injection terahertz and infrared lasers. (C) 2013 AIP Publishing LLC.
引用
收藏
页数:9
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