Effect of thickness on structural, optical and magnetic properties of Co doped ZnO thin film by pulsed laser deposition

被引：0

作者：

Kamalianfar, A. ^{[1
,2
]}

Halim, S. A. ^{[1
,3
]}

Behzad, Kasra ^{[1
]}

Naseri, Mahmoud Goodarz ^{[1
]}

Navasery, M. ^{[1
]}

Din, Fasih Ud ^{[1
]}

Zahedi, J. A. M. ^{[4
]}

Lim, K. P. ^{[1
]}

Chen, S. K. ^{[1
]}

Sidek, H. A. A. ^{[1
]}

机构：

[1] Univ Putra Malaysia, Fac Sci, Dept Phys, Serdang 43400, Selangor, Malaysia

[2] Univ Jahrom, Fac Sci, Dept Phys, Jahrom 6617174137, Iran

[3] Univ Putra Malaysia, Inst Math Res, Serdang 43400, Selangor, Malaysia

[4] Islamic Azad Univ, Karaj Branch, Dept Phys, Karaj, Iran

来源：

JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS | 2013年 / 15卷 / 3-4期

关键词：

Co-doped ZnO; Thin Film; PLD; Dilute magnetic semiconductor; SEMICONDUCTOR;

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Zn0.97Co0.03O thin films were deposited on n-type silicon substrate (111) using pulsed laser deposition (PLD) technique with different thicknesses of 200 +/- 20nm, 320 +/- 20nm, and 480 +/- 20nm. The Zn0.97Co0.03O powders prepared by sol-combustion were formed as pellets. A neodymium-doped yttrium aluminum garnet (Nd:YAG) class 4 laser (lambda = 266 nm, 5-8 pulse duration, 2 Hz duration rate) were used for the PLD of the nanostructures. The structure of the prepared thin films was investigated using different techniques such as X-ray diffraction (XRD) and field emission scanning electron microscope (FESEM). The optical properties of prepared thin films were investigated using UV-vis spectrometry. In addition, the magnetic properties of the samples were studied by vibrating sample magnetometer (VSM). The results showed that the properties of the thin films altered by thickness changes.

引用

页码：239 / 243

页数：5

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