Manufacturability and sustainability analysis of nano-scale manufacturing

被引：0
|
作者：
Yuan, Chris Y. [1 ]
Dornfeld, David [1 ]
机构：
[1] Univ Calif Berkeley, Dept Mech Engn, Berkeley, CA 94720 USA
来源：
2008 IEEE INTERNATIONAL SYMPOSIUM ON ELECTRONICS AND THE ENVIRONMENT | 2008年
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D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：71 / 71
页数：1
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