Methods for atom probe study of near surface zones in cemented carbides

被引:2
|
作者
Frykholm, R [1 ]
Andrén, HO
机构
[1] Chalmers Univ Technol, Dept Expt Phys, SE-41296 Gothenburg, Sweden
[2] Univ Gothenburg, SE-41296 Gothenburg, Sweden
关键词
microanalysis; hard metals; gradient sintering; specimen preparation;
D O I
10.1016/S0304-3991(99)00061-3
中图分类号
TH742 [显微镜];
学科分类号
摘要
Methods to prepare atom probe specimens from near-surface regions of cemented carbide cutting tool inserts have been developed. The preparation technique involves dimple grinding and electropolishing. The specimens are prepared parallel to the surface to allow pulse electropolishing without changing the depth from the surface. The material studied is a gradient sintered WC-Ti(C, N)-Co based cutting tool insert with a gradient thickness of 35 mu m. We have so far been able to produce a tip within 5 +/- 2 mu m from the zone border. Furthermore, the method makes it possible to prepare tips from as close as 10 mu m from the surface. An atom probe analysis of a region near the zone border is presented. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:283 / 286
页数:4
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