A Rietveld-analysis program for X-ray powder spectro-diffractometry

被引：4

作者：

Xiao, Y ^{[1
]}

Hayakawa, S

Gohshi, Y

Oshima, M

Izumi, F

Okudera, H

Toraya, H

Ohsumi, K

机构：

[1] Univ Tokyo, Sch Engn, Dept Appl Chem, Tokyo 1138656, Japan

[2] Natl Inst Res Inorgan Mat, Ibaraki, Osaka 3050044, Japan

[3] Nagoya Inst Technol, Ceram Res Lab, Tajimi 5070071, Japan

[4] High Energy Accelerator Res Org, Inst Mat Struct Sci, Tsukuba, Ibaraki 3050801, Japan

来源：

POWDER DIFFRACTION | 1999年 / 14卷 / 02期

关键词：

RIETAN; spectro-diffractometry; anomalous scattering; Rietveld analysis;

D O I：

10.1017/S088571560001037X

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

In order to exploit X-ray powder spectro-diffractometry, the program. RIETAN-97 beta for refining crystal structure and lattice parameters by the Rietveld method was modified extensively. The resulting software can be used to refine anomalous scattering factors, f(r) and f(i), for specified crystallographic sites near the X-ray absorption edge of a particular element. The effectiveness of the modified software was tested by using powder diffraction patterns simulated by the original RIETAN-97 beta software and a series of measured powder diffraction patterns of Fe3O4 with incident X-ray energies near the absorption edge of iron. (C) 1999 International Centre for Diffraction Data. [S0885-7156(98)01204-4].

引用

页码：106 / 110

页数：5

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