Scanning near-field optical microscopy in life science

被引:0
|
作者
Jauss, A [1 ]
Koenen, J [1 ]
Weishaupt, K [1 ]
Hollricher, O [1 ]
机构
[1] WITec GmbH, Ulm, Germany
关键词
SNOM; NSOM; histological cuts; chromosomes;
D O I
10.1002/1438-5171(200208)3:4<232::AID-SIMO232>3.0.CO;2-S
中图分类号
Q5 [生物化学];
学科分类号
071010 ; 081704 ;
摘要
Scanning Near-field Optical Microscopy (SNOM) allows optical microscopy with highest spatial resolution beyond the diffraction limit. We present a new microscope set-up which uses micro-machined cantilever SNOM sensors and combines in a unique way the advantages of Scanning Near-field Optical Microscopy, Confocal Scanning Microscopy (CSM) and Atomic Force Microscopy (AFM) in one instrument. Results from measurement at different samples system like histological microtome cuts and fluorescent labelled human chromosomes are shown to demonstrate the capabilities of the new set-up.
引用
收藏
页码:232 / 235
页数:4
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