Fast irreducibility and subgroup membership testing in XTR

被引：0
|
作者：
Lenstra, AK
Verheul, ER
机构：
[1] Tech Univ Eindhoven, Citibank NA, Mendham, NJ 07945 USA
[2] PricewaterhouseCoopers, GRMS Crypto Grp, NL-5644 KE Eindhoven, Netherlands
来源：
PUBLIC KEY CRYPTOGRAPHY, PROCEEDINGS | 2001年 / 1992卷
关键词：
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
We describe a new general method to perform part of the setup stage of the XTR system introduced at Crypto 2000, namely finding the trace of a generator of the XTR group. Our method is substantially faster than the general method presented at Asiacrypt 2000. As a side result, we obtain an efficient method to test subgroup membership when using XTR.
引用
收藏
页码：73 / 86
页数：14
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