Bulk ferromagnetic tips for spin-polarized scanning tunneling microscopy

被引：6
|
作者：
Haze, Masahiro [1 ,2 ]
Yang, Hung-Hsiang [1 ]
Asakawa, Kanta [1 ]
Watanabe, Nobuyuki [1 ]
Yamamoto, Ryosuke [1 ,4 ]
Yoshida, Yasuo [1 ,3 ]
Hasegawa, Yukio [1 ]
机构：
[1] Univ Tokyo, Inst Solid State Phys, Kashiwa, Chiba 2778581, Japan
[2] Kyoto Univ, Dept Phys, Sakyo Ku, Kyoto 6068502, Japan
[3] Kanazawa Univ, Dept Phys, Kanazawa, Ishikawa 9201192, Japan
[4] Univ Tokyo, Dept Chem, Tokyo, Japan
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2019年 / 90卷 / 01期
关键词：
D O I：
10.1063/1.5063759
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
We characterized the performance of electrochemically etched bulk Fe and Ni tips as a probe of spin-polarized scanning tunneling microscopy (SP-STM). Through the observation of the striped contrast on the conical spin-spiral structure formed in Mn-double layers on a W(110) substrate, the capability of both the tips to detect the magnetic signal was clarified. We also confirmed that the magnetized direction of the Fe and Ni tips can be flipped between the two out-of-plane directions by external magnetic fields. Our results demonstrate that the ex-situ prepared tips are reliable in SP-STM for the samples that are not susceptible to a stray magnetic field. Published under license by AIP Publishing.
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页数：6
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