Ag(Ta0.5Nb0.5)O3 Thick Film Based Microwave Band Pass Filters

被引:0
|
作者
Lee, H. [1 ]
Jung, T. S. [1 ]
Lee, J. C. [1 ]
Lee, K. S. [2 ]
Chae, M. S. [2 ]
Koh, J. H. [2 ]
机构
[1] Kwangwoon Univ, Dept Wireless Commun Engn, Seoul 139701, South Korea
[2] Kwangwoon Univ, Dept Elect Mat Engn, Seoul 139701, South Korea
基金
新加坡国家研究基金会;
关键词
Ag(Ta0.5Nb0.5)O-3 thick film; two-layered band-pass filter;
D O I
10.1080/10584587.2013.778739
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report on the simulated performance of a two-layered Microstrip and Coplanar Waveguide (CPW) band-pass filters by using one layer simulation method. The two layer is composed of Ag(Ta0.5Nb0.5)O-3 (ATN) thick film and alumina substrate. The ATN thick film of about 7m in thickness is prepared by screen printing method on an alumina substrate of about 635m in thickness at a sintered temperature and time of 1150 degrees C and 2 hrs, respectively. Au conductor of about 2m in thickness is deposited by sputtering method. The 2-pole band-pass filters are designed for a center frequency of 5.88GHz, and 5.76GHz with 7.8% and 8.6% bandwidth, respectively. Both ATN-based filters offer a similar selectivity as well as a loss parameter compared to that of two-layer simulation.
引用
收藏
页码:64 / 71
页数:8
相关论文
共 50 条
  • [1] The electric and dielectric properties of Ag(Ta0.5Nb0.5)O3 and Ag(Ta0.8Nb0.2)O3 thick films
    Lee, Ku-Tak
    Koh, Jung-Hyuk
    CURRENT APPLIED PHYSICS, 2011, 11 (03) : S56 - S59
  • [2] Structural and Electrical Characterization of Ag(Ta0.5Nb0.5)O3 and Ag(Ta0.8Nb0.2)O3 Ceramics
    Lee, Ku-tak
    Yun, Seok-Woo
    Koh, Jung-Hyuk
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2011, 59 (03) : 2478 - 2481
  • [3] Effects of Li doping on dielectric properties of Ag(Ta0.5Nb0.5)O3
    Chae, Moon-Soon
    Koh, Jung-Hyuk
    CERAMICS INTERNATIONAL, 2013, 39 : S457 - S460
  • [4] K0.9Li0.1(Ta0.5Nb0.5)O3晶体压电应变系数的测量
    尹鑫
    魏景谦
    王继扬
    压电与声光, 1994, (05) : 55 - 56
  • [5] Structures and electrical properties of (Na0.5K0.5)NbO3–Li(Ta0.5Nb0.5)O3 lead-free piezoelectric ceramics
    Ruzhong Zuo
    Shi Su
    Jian Fu
    Zhengkui Xu
    Journal of Materials Science: Materials in Electronics, 2009, 20 : 469 - 472
  • [6] Structures and electrical properties of (Na0.5K0.5)NbO3-Li(Ta0.5Nb0.5)O3 lead-free piezoelectric ceramics
    Zuo, Ruzhong
    Su, Shi
    Fu, Jian
    Xu, Zhengkui
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2009, 20 (05) : 469 - 472
  • [7] (001) epitaxial Ag(Ta0.5Nb0.5)O3 thin films on (001)SrRuO3/(001)LaAlO3 substrates by chemical solution deposition
    Telli, M. B.
    Bharadwaja, S. S. N.
    Biegalski, M. D.
    Cheng, J. G.
    Trolier-McKinstry, S.
    JOURNAL OF APPLIED PHYSICS, 2007, 101 (01)
  • [8] Fabrication of (K0.5Na0.5)(Nb0.7Ta0.3)O3 Thick Films by Electrophoretic Deposition
    Vineetha, P.
    Saravanan, K. Venkata
    2ND INTERNATIONAL CONFERENCE ON CONDENSED MATTER AND APPLIED PHYSICS (ICC-2017), 2018, 1953
  • [9] The Microwave Properties of Ag(Ta0.8Nb0.2)O3 Thick Film Interdigital Capacitors on Alumina Substrates
    Lee, Ku-Tak
    Koh, Jung-Hyuk
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2012, 60 (02) : 276 - 279
  • [10] The microwave properties of Ag(Ta0.8Nb0.2)O3 thick film interdigital capacitors on alumina substrates
    Ku-Tak Lee
    Jung-Hyuk Koh
    Journal of the Korean Physical Society, 2012, 60 : 276 - 279