Characterization method of polycrystalline materials using conductive atomic force microscopy

被引：0
|
作者：
Ding Xi-Dong [1 ]
Fu Gang [2 ]
Xiong Xiao-Min [1 ]
Zhang Jin-Xiu [1 ]
机构：
[1] Sun Yat Sen Univ, Sch Phys & Engn, State Key Lab Optoelect Mat & Technol, Guangzhou 510275, Guangdong, Peoples R China
[2] Guangzhou Univ, Dept Phys, Guangzhou 510405, Guangdong, Peoples R China
来源：
CHINESE PHYSICS LETTERS | 2008年 / 25卷 / 10期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
An apparatus for characterization of polycrystalline materials based on conductive atomic force microscopy (cAFM) is developed and a quantitative measurement of electrical characteristics of individual grains in polycrystalline ZnO ceramic is demonstrated. Improvement of the experimental method is presented. Experimental results illuminate unambiguously the different electrical characteristics between individual grains, suggesting the suitability and maneuverability of this method in the study of local structure or properties and their relationship in polycrystalline materials such as semi-conducting ceramics.
引用
收藏
页码：3597 / 3600
页数：4
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