Materials characterization using high-frequency atomic force microscopy and friction force microscopy

被引：0
|
作者：
Scherer, V
Janser, K
Rabe, U
Arnold, W
Meissner, O
机构：
来源：
REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLS 16A AND 16B | 1997年 / 16卷
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中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
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页码：1391 / 1398
页数：8
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