Vector magneto-optical generalized ellipsometry for sculptured thin films

被引：14
|
作者：
Schmidt, Daniel [1 ]
Briley, Chad
Schubert, Eva
Schubert, Mathias
机构：
[1] Univ Nebraska, Dept Elect Engn, Lincoln, NE 68588 USA
来源：
APPLIED PHYSICS LETTERS | 2013年 / 102卷 / 12期
基金：
美国国家科学基金会;
关键词：
MAGNETIC-PROPERTIES; ANGLE DEPOSITION;
D O I：
10.1063/1.4799365
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Vector magneto-optical generalized ellipsometry is employed for the determination of the three-dimensional magnetization properties of magnetized thin solid as well as slanted columnar thin film samples. The permalloy thin films were probed by means of Mueller matrix ellipsometry at room-temperature while an external magnetic field was rotated step-wise within each plane of a three-dimensional Cartesian coordinate system (spatial hysteresis loops). Model analysis of the magneto-optical coupling parameter (proportional to the magnetization) confirms the expected uniaxial magnetization shape of the thin solid film and reveals the three-dimensional magneto-optic anisotropy of the nanostructured thin film. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4799365]
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页数：4
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