Double-peak distribution of electron and ion emission profile during femtosecond laser ablation of metals

被引：62
|
作者：
Amoruso, S
Wang, X
Altucci, C
de Lisio, C
Armenante, M
Bruzzese, R
Spinelli, N
Velotta, R
机构：
[1] Univ Basilicata, Dipartimento Ingn & Fis Ambiente, I-85100 Potenza, Italy
[2] Ist Nazl Fis Nucl, Sezione Napoli, I-80126 Naples, Italy
[3] Univ Basilicata, Dipartimento Chim, I-85100 Potenza, Italy
[4] Univ Naples Federico II, Dipartimento Sci Fis, I-80126 Naples, Italy
[5] Univ Naples Federico II, INFM, I-80126 Naples, Italy
来源：
APPLIED SURFACE SCIENCE | 2002年 / 186卷 / 1-4期
关键词：
ultrashort laser ablation; time-of-flight technique;
D O I：
10.1016/S0169-4332(01)00679-1
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Femtosecond laser ablation of metals with a Ti:sapphire laser system has been investigated by a time-of-flight mass spectroscopy technique, Ion mass spectra show a double-peak distribution, evidencing the presence of a high-energy component (up to few keV). even at moderate laser intensities (10(12)-10(13) W cm(-2)). Two different ablation regimes were identified for the less energetic component, and explained in the framework of the two-temperature modeling of ultrashort laser pulse-solid target interactions. Ambipolar diffusion has been identified as the probable mechanism giving rise to the observed high-energy plasma plume component. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：358 / 363
页数：6
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