Global well-posedness of weak solutions and a regularity criterion of strong solutions for an epitaxial growth model

被引：1
|
作者：
Fan, Jishan [1 ]
Samet, Bessem [2 ]
Zhou, Yong [3 ]
机构：
[1] Nanjing Forestry Univ, Dept Appl Math, Nanjing 210037, Jiangsu, Peoples R China
[2] King Saud Univ, Coll Sci, Dept Math, POB 2455, Riyadh 11451, Saudi Arabia
[3] Sun Yat Sen Univ, Sch Math Zhuhai, Zhuhai 519082, Peoples R China
来源：
APPLIED MATHEMATICS LETTERS | 2018年 / 80卷
关键词：
Weak solution; Strong solution; Epitaxy; Thin film; THIN-FILM EPITAXY; CRYSTAL-SURFACES; STEP MOTION;
D O I：
10.1016/j.aml.2017.12.023
中图分类号：
O29 [应用数学];
学科分类号：
070104 ;
摘要：
In this paper, we first prove global well-posedness of weak solutions for an epitaxial growth model with L-2 initial data in any dimension d. Then, we establish a regularity criterion of strong solutions with dimension d >= 3. (C) 2018 Elsevier Ltd. All rights reserved.
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页码：8 / 11
页数：4
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