Finite Element Analysis Route to Achieve Accurate Resistivity Measurements in Diamond Anvil Cell

被引：0
|
作者：
Nan, Xuanguo [2 ]
Peng, Gang [3 ]
Wu, Baojia [1 ]
机构：
[1] Yanbian Univ, Coll Sci, Yanji 133002, Peoples R China
[2] Yanbian Univ, Coll Engn, Yanji 133002, Peoples R China
[3] Jilin Univ, State Key Lab Superhard Mat, Changchun 130012, Peoples R China
来源：
LEADING EDGE OF MICRO-NANO SCIENCE AND TECHNOLOGY | 2013年 / 669卷
基金：
中国国家自然科学基金;
关键词：
high pressure; finite element analysis; resistivity; diamond anvil cell; HIGH-PRESSURE; ELECTRICAL-RESISTANCE;
D O I：
10.4028/www.scientific.net/AMR.669.279
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
To have a clear understanding of the effect of electrode resistivity on the in-situ resistivity measurement under high pressure in a diamond anvil cell (DAC), we perform finite element analysis (FEA) to simulate the distribution of the steady current field in sample. The theoretical analysis reveals the origin of the effect. It is caused by the resistivity difference between electrodes and sample. And the more the difference of their resistivity is, the more obvious the effect is. All these will result in large resistivity error. However we find that reducing the resistivity difference between the electrode and sample can improve the results.
引用
收藏
页码：279 / +
页数：2
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