Current testable design of resistor string DACs

被引:0
|
作者
Hashizume, M [1 ]
Nishida, T
Yotsuyanagi, H
Tamesada, T
Miura, Y
机构
[1] Univ Tokushima, Fac Engn, Tokushima 770, Japan
[2] Tokyo Metropolitan Univ, Fac Syst Design, Tokyo, Japan
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, supply current testability is examined experimentally for opens and shorts in a general 3 bit resistor string Digital/Analog converter(DAC). The results show that all of the shorts and the opens are detected by supply current testing, while opens of the MOS switches are not detected A DFT method for resistor string DACs is proposed in this paper to detect the opens by supply current testing. Also, testability of a resistor string DAC designed with the DFT method is examined. It is shown that all of the targeted shorts and opens in the testable designed DAC are detected by supply current testing.
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页码:197 / +
页数:2
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