A double-path measurement head for strain measurements with modulation interferometry

被引:0
|
作者
Kloos, G [1 ]
机构
[1] EINDHOVEN UNIV TECHNOL,NL-5600 MB EINDHOVEN,NETHERLANDS
关键词
D O I
10.1016/S0143-8166(97)00011-0
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The design of a new measurement head for interferometric dilatometry is presented. It is shown how a double-path detection scheme can be implemented in a homodyne interferometer. Possible applications of the proposed instrument include the investigation of quadratic electrostriction and the inverse piezoelectric effect. (C) 1997 Elsevier Science Ltd.
引用
收藏
页码:287 / 291
页数:5
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