Interface stability of thin, dense CGO film coating on YSZ for solid oxide fuel cells

被引：29

作者：

Constantin, G. ^{[1
]}

Rossignol, C. ^{[1
]}

Barnes, J. -P. ^{[2
]}

Djurado, E. ^{[1
]}

机构：

[1] Univ Grenoble 1, Univ Savoie, Grenoble INP, LEPMI,CNRS,UMR 5279, F-38402 St Martin Dheres, France

[2] CEA, LETI, F-38054 Grenoble 9, France

来源：

SOLID STATE IONICS | 2013年 / 235卷

关键词：

Reactivity; ESD; ToF-SIMS; CGO; YSZ; EIS; DOPED CERIA; REFERENCE ELECTRODE; ELECTROCHEMICAL PROPERTIES; EXPERIMENTAL LIMITATIONS; IMPEDANCE SPECTROSCOPY; THERMAL-EXPANSION; IT-SOFC; ZIRCONIA; CATHODE; MICROSTRUCTURE;

D O I：

10.1016/j.ssi.2013.01.015

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

An electrostatic spray pyrolysis method (ESD) was applied for the preparation of a dense, continuous and crack-free thin film of gadolinia-doped ceria (Ce0.9Gd0.1O2-delta, CGO) on pure YSZ ((ZrO2)(0.92)(Y2O3)(0.08)) substrate for intermediate temperature solid oxide fuel cell (IT-SOFC) applications. ToF-SIMS depth profiles and XRD were performed to characterize the possible interfacial reactivity. No reaction was detected between CGO layer and YSZ substrate after heat treatment at 800 degrees C for 2 h in air. After heat treatment at 1500 degrees C during 10 h in air a (YSZ)(1-x)(CGO)(x) solid solution was detected in homogeneous composition at least over 6 pm in thickness. No differences were observed between the impedance spectra of YSZ reference, the CGO/YSZ bi-layer and the solid solution. (C) 2013 Elsevier B.V. All rights reserved.

引用

页码：36 / 41

页数：6

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