Numerical and experimental correlation of high temperature reliability of gold wire bonding to intermetallics (Au/Al) uniformity

被引:16
|
作者
Zhang, XR [1 ]
Tee, TY [1 ]
机构
[1] STMicroelect, Singapore 319521, Singapore
关键词
intermetallics; high temperature storage; modeling; wire bond;
D O I
10.1016/j.tsf.2005.09.121
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A study of the Au/Al intermetallics compound (IMC) in gold wire bonds on aluminum pads is presented. A test vehicle has been deliberately built for high temperature storage (HTS) test. There are two kinds of samples, i.e., one is with uniform intermetallics in the ball bond at time zero, and another one is with non-uniform intermetallics. It is found that the package with initial uniform intermetallics passed the HTS test, while the package with initial non-uniform intermetallics failed with ball lift failure after HTS storage. Unique thereto-mechanical simulation is performed to understand the failure mechanism for HTS. Two types of intermetallics model have been established correspondingly, i.e., one with uniform intermetallics and another one with non-uniform intermetallics. The volume-induced stress under HTS has been simulated. It is found that the difference between FMC stresses in uniform and non-uniform models is not obvious, while there is a large difference between stresses in gold area of uniform and non-uniform model. For the non-uniform model, high normal tensile stress exists in the inner convex areas of gold bond, which connect two pieces of separate intermetallics, while for the uniform model, there is no such high stress area. The interfaces between Au and FMC in non-uniform model are the critical interfaces with high stress. It is indicated from these results that HTS life is much longer for the bond with uniform IMC than that with nonuniform IMC. The thereto-mechanical stress model correlates well with the test results. (c) 2005 Elsevier B.V All rights reserved.
引用
收藏
页码:355 / 361
页数:7
相关论文
共 49 条
  • [31] Effect of Pd Surface Roughness on the Bonding Process and High Temperature Reliability of Au Ball Bonds
    Huang, Y.
    Kim, H. J.
    McCracken, M.
    Viswanathan, G.
    Pon, F.
    Mayer, M.
    Zhou, Y. N.
    JOURNAL OF ELECTRONIC MATERIALS, 2011, 40 (06) : 1444 - 1451
  • [32] High temperature storage reliability investigation of the Al-Cu wire bond interface
    Pelzer, R.
    Nelhiebel, M.
    Zink, R.
    Woehlert, S.
    Lassnig, A.
    Khatibi, G.
    MICROELECTRONICS RELIABILITY, 2012, 52 (9-10) : 1966 - 1970
  • [33] Metallurgical behavior of Au/Al bond interface during high temperature storage of ultrasonic wedge bonding
    Li, Mingyu
    Li, Song
    Ji, Hongjun
    ICEPT: 2006 7TH INTERNATIONAL CONFERENCE ON ELECTRONICS PACKAGING TECHNOLOGY, PROCEEDINGS, 2006, : 641 - +
  • [34] Inhibition mechanism of palladium on intermetallic compounds in Au-Al bonding under high temperature storage
    Liang, Zhimin
    Zhao, Xinyu
    Li, Yunjia
    Rao, Yuzhong
    Wang, Kehong
    Wang, Xiaobing
    SOLDERING & SURFACE MOUNT TECHNOLOGY, 2024,
  • [35] An experimental and numerical investigation into the effects of the chip-on-film (COF) processing parameters on the Au-Sn bonding temperature
    Liu, De-Shin
    Yeh, Shu-Shen
    Kao, Chun-Teh
    Huang, Pay-Yau
    Tsai, Chia-I
    Liu, An-Hong
    Ho, Shu-Ching
    SOLDERING & SURFACE MOUNT TECHNOLOGY, 2010, 22 (04) : 31 - 41
  • [36] Joint reliability of Al wire bonding on OSP and ENIG surface-finished substrates under complex stress induced with current and temperature
    Ahn, Byeongjin
    Kim, Jahyeon
    Cheon, Gyeong-Yeong
    Lee, Tae-Ik
    Park, Young-Bae
    Kim, Jungsoo
    Ko, Yong-Ho
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2022, 33 (26) : 21127 - 21136
  • [37] Joint reliability of Al wire bonding on OSP and ENIG surface-finished substrates under complex stress induced with current and temperature
    Byeongjin Ahn
    Jahyeon Kim
    Gyeong-Yeong Cheon
    Tae-Ik Lee
    Young-Bae Park
    Jungsoo Kim
    Yong-Ho Ko
    Journal of Materials Science: Materials in Electronics, 2022, 33 : 21127 - 21136
  • [38] Experimental study on the fracture behavior variation of the Au stud bump bonding with different high temperature storage times
    Zhang, Xiangou
    Wang, Yuexing
    Sun, Xiangyu
    Deng, Zejia
    Pu, Yingdong
    Zhang, Ping
    Huang, Zhiyong
    Zhou, Quanfeng
    MICROELECTRONICS INTERNATIONAL, 2024, 41 (02) : 82 - 88
  • [39] Explaining Nondestructive Bond Stress Data from High-Temperature Testing of Au-Al Wire Bonds
    McCracken, Michael James
    Koda, Yusuke
    Kim, Hyoung Joon
    Mayer, Michael
    Persic, John
    Hwang, June Sub
    Moon, Jeong-Tak
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2013, 3 (12): : 2029 - 2036
  • [40] Experimental and Numerical Studies on Self-Propagating High-Temperature Synthesis of Ta5Si3 Intermetallics
    Yeh, Chun-Liang
    Chou, Chi-Chian
    Hwang, Po-Wen
    METALS, 2015, 5 (03): : 1580 - 1590