A new approach for measuring the value of patents based on structural indicators for ego patent citation networks

被引：33
|
作者：
Hu, Xiaojun [1 ]
Rousseau, Ronald [2 ,3 ,4 ]
Chen, Jin [5 ]
机构：
[1] Zhejiang Univ, Med Informat Ctr, Sch Med, Hangzhou 310058, Zhejiang, Peoples R China
[2] KHBO Assoc KU Leuven, Fac Engn Technol, B-8400 Oostende, Belgium
[3] Univ Antwerp, IBW, B-2000 Antwerp, Belgium
[4] Katholieke Univ Leuven, Dept Math, B-3000 Louvain, Belgium
[5] Zhejiang Univ, Coll Publ Adm, Hangzhou 310027, Peoples R China
来源：
JOURNAL OF THE AMERICAN SOCIETY FOR INFORMATION SCIENCE AND TECHNOLOGY | 2012年 / 63卷 / 09期
基金：
中国国家自然科学基金;
关键词：
scientometrics; citation networks; knowledge management;
D O I：
10.1002/asi.22632
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
Technology sectors differ in terms of technological complexity. When studying technology and innovation through patent analysis it is well known that similar amounts of technological knowledge can produce different numbers of patented innovation as output. A new multilayered approach to measure the technological value of patents based on ego patent citation networks (PCNs) is developed in this study. The results show that the structural indicators for the ego PCN developed in this contribution can characterize groups of patents and, hence, in an indirect way, the health of companies.
引用
收藏
页码：1834 / 1842
页数：9
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