Dielectric functions of common YBCO substrate materials determined by spectroscopic ellipsometry

被引：16
|
作者：
Gibbons, BJ
TrolierMcKinstry, S
机构：
[1] Intercollege Materials Research Laboratory, Pennsylvania State University, University Park
来源：
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 1997年 / 7卷 / 02期
关键词：
D O I：
10.1109/77.621025
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Reference dielectric function data for several common YBa2Cu3O7-delta (YBCO) substrate material shave been determined by spectroscopic ellipsometry over the range 250 nm - 750 nm. These materials include LaAlO3, BaZrO3, NdGaO3, 9.5 mol% Y2O3-ZrO2 (YSZ), LaSrGaO4 (LSGO), and (LaAlO3)(0.3)-(Sr2AlTaO6)(0.7) (LSAT). The precision of the data was confirmed by comparing SE determined data for SrTiO3 to published values. Agreement to the third decimal point was shown. These data have been used to characterize interfaces between YBCO and some of these materials by SE.
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页码：2177 / 2180
页数：4
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