共 50 条
- [21] X-ray measurement of residual stress in patterned aluminum thin films sputtered on silicon wafers JSME INTERNATIONAL JOURNAL SERIES A-SOLID MECHANICS AND MATERIAL ENGINEERING, 1998, 41 (02): : 290 - 296
- [22] Phase Identification of RF-Sputtered SnS Thin Films Using Rietveld Analysis of X-ray Diffraction Patterns 2013 IEEE 39TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), 2013, : 2562 - 2566
- [23] High throughput measurements of soft x-ray impurity emission using a multilayer mirror telescope REVIEW OF SCIENTIFIC INSTRUMENTS, 2006, 77 (10):
- [24] Optimization of Co-sputtered FePt films using X-ray Scattering Techniques 62ND DAE SOLID STATE PHYSICS SYMPOSIUM, 2018, 1942
- [25] Thickness determination of metal thin films with spectroscopic ellipsometry for x-ray mirror and multilayer applications JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1999, 17 (05): : 2741 - 2748
- [26] Line shape analysis of linear X-ray magnetic scattering CoPt thin films MODERN PHYSICS LETTERS B, 2006, 20 (01): : 31 - 37
- [28] X-ray photoelectron spectroscopy characterization of radio frequency reactively sputtered carbon nitride thin films JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1996, 14 (05): : 2687 - 2692
- [29] X-Ray photoelectron spectroscopy characterization of reactively sputtered Ti-B-N thin films SURFACE & COATINGS TECHNOLOGY, 2004, 187 (01): : 98 - 105