Universal electric and magnetic field analyzer system

被引：0

作者：

Ho, Yong Cheh ^{[1
]}

Pommerenke, David ^{[1
]}

Li, Tun ^{[1
]}

机构：

[1] Missouri Univ Sci & Technol, Electromagnet Compatibil Lab, Rolla, MO 65409 USA

来源：

2008 ASIA-PACIFIC SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY AND 19TH INTERNATIONAL ZURICH SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, VOLS 1 AND 2 | 2008年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Near-field probing is often used to determine the Sources and coupling paths of an electromagnetic interference problem above a printed circuit board or integrated circuits chip. A wideband universal field analyzer was developed in order to measure circularly and linearly polarized magnetic fields and total electric field in a rapid sequence using a single probe design.

引用

页码：391 / 394

页数：4

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