Universal electric and magnetic field analyzer system

被引：0
|
作者：
Ho, Yong Cheh [1 ]
Pommerenke, David [1 ]
Li, Tun [1 ]
机构：
[1] Missouri Univ Sci & Technol, Electromagnet Compatibil Lab, Rolla, MO 65409 USA
来源：
2008 ASIA-PACIFIC SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY AND 19TH INTERNATIONAL ZURICH SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, VOLS 1 AND 2 | 2008年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Near-field probing is often used to determine the Sources and coupling paths of an electromagnetic interference problem above a printed circuit board or integrated circuits chip. A wideband universal field analyzer was developed in order to measure circularly and linearly polarized magnetic fields and total electric field in a rapid sequence using a single probe design.
引用
收藏
页码：391 / 394
页数：4
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