Surface-induced dissociation of lanthanum metallofullerenes on a fluorinated self-assembled monolayer film

被引：5

作者：

Kimura, T ^{[1
]}

Sugai, T ^{[1
]}

Shinohara, H ^{[1
]}

机构：

[1] Nagoya Univ, Dept Chem, Nagoya, Aichi 4648602, Japan

来源：

CHEMICAL PHYSICS LETTERS | 1999年 / 304卷 / 3-4期

基金：

日本学术振兴会;

关键词：

D O I：

10.1016/S0009-2614(99)00305-X

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Surface-induced dissociation (STD) of purified La@C-82 on a fluorinated self-assembled monolayer (F-SAM) film has been studied by a reflectron-type time-of-flight mass spectrometer modified for measuring SID spectra. Lanthanum-containing fragments LaCn+ formed as a result of sequential C-2-loss processes have been observed. No lanthanum-stripping fragmentation was observed, up to 160 eV collision energies. The SID of LaC60 on the F-SAM film has also been investigated up to 100 eV collision energies. The SID profiles of LaC60 are similar to those of La@C-82 which strongly suggests that La@C-60, like La@C-82, has an endohedral structure. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：211 / 216

页数：6

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