Microstructure and magnetic properties of Fe/KCoF3 thin films

被引：1
|
作者：
Malkinski, L.
Zhou, W. L.
He, J.
Celinski, Z.
Camley, R.
O'Keevan, T.
Yano, J.
Pivoda, T.
Vovk, A.
Hecker, M.
Schneider, C. M.
Szade, J.
Skrzypek, D.
机构：
[1] Univ New Orleans, Adv Mat Res Inst, New Orleans, LA 70148 USA
[2] Univ Colorado, Dept Phys, Colorado Springs, CO 80918 USA
[3] Inst Solid State & Mat Res, D-01069 Dresden, Germany
[4] Univ Silesia, Inst Phys, PL-40007 Katowice, Poland
[5] Polish Acad Sci, Inst Phys, PL-02668 Warsaw, Poland
来源：
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 2004年 / 272卷
关键词：
thin magnetic films; epitaxial growth; exchange bias; magnetic anisotropy;
D O I：
10.1016/j.jmmm.2003.12.226
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
A molecular beam epitaxy system was used to deposit a ferro/anitiferromagnet (Fe/KCoF3) structures. Depending on the deposition conditions the fluoride grew either in the single crystal or polycrystalline forms, which was initially confirmed by the RHEED patterns and X-ray studies. The crystalline form of the KCoF3 significantly affected magnetic properties, in particular exchange bias and magnetocrystalline anisotropy. Extensive transmission electron microscopy (TEM) studies have been made in order to reveal more details on the microstructure of the fluoride and of the Fe/KCoF3 interface. (C) 2003 Elsevier B.V. All rights reserved.
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页码：E901 / E903
页数：3
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