CCD testing for DECam (Dark Energy Survey Camera)

被引：1

作者：

Kubik, Donna ^{[1
]}

机构：

[1] Fermilab Natl Accelerator Lab, Batavia, IL 60510 USA

来源：

PROCEEDINGS OF THE 2ND INTERNATIONAL CONFERENCE ON TECHNOLOGY AND INSTRUMENTATION IN PARTICLE PHYSICS (TIPP 2011) | 2012年 / 37卷

关键词：

CCDs; focal plane arrays;

D O I：

10.1016/j.phpro.2012.03.744

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The Dark Energy Survey Camera (DECam) will be comprised of a mosaic of 74 charge-coupled devices (CCDs). The DES science goals set stringent technical requirements for the CCDs. The CCDs are provided by LBNL with valuable cold probe data at 233 K, providing an indication of which CCDs are more likely to pass. After comprehensive testing of 270 CCDs at 273 K, 124 qualify as science grade. Testing this large number of CCDs to determine which best meet the DES requirements is a very time-consuking task. We developed a multistage testing program to automatically collect and analyze CCD test data. (C) 2011 Published by Elsevier B.V. Selection and/or peer review under responsibility of the organizing committee for TIPP 11.

引用

页码：1427 / 1434

页数：8

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