The effect of material interfaces on electrical tree growth and breakdown time of epoxy resin

被引：0
|
作者：
Pattouras, M. [1 ]
Tzimas, A. [1 ]
Rowland, S. M. [1 ]
机构：
[1] Univ Manchester, Sch Elect & Elect Engn, Manchester M13 9PL, Lancs, England
来源：
2013 IEEE CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA (CEIDP) | 2013年
基金：
英国工程与自然科学研究理事会;
关键词：
PROPAGATION; BARRIER;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This study investigates the effect of barriers and interfaces on the lifetime of epoxy resin samples, as well as the growth characteristics of electrical trees. Four sample types are presented; all having been prepared in the point-plane configuration using a hypodermic needle as the HV electrode. Tests were carried out at 13 kV rms and sample images were taken at fixed one minute intervals during the test period. Results show that the incorporation of a barrier improves the time to breakdown of the epoxy resin tested. The inclusion of a major void defect did not accelerate failure of a sample which included an effective barrier.
引用
收藏
页码：796 / 799
页数：4
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