Reliability Test and Analysis for Vibration-Induced Solder Joint Failure of PBGA Assembly

被引:0
|
作者
Zhou, Bin [1 ]
En, Yunfei [1 ]
Qi, Xueli [1 ]
机构
[1] CEPREI, Sci & Technol Reliabil Phys & Applicat Elect Comp, Guangzhou, Guangdong, Peoples R China
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In order to understand the vibration characteristic of plastic BGA solder joints, the test vehicles with daisy chain were designed, vibration reliability test platform and real-time monitoring platform were developed, a series of vibration test including sweep vibration at different levels and random vibration were conducted, and the comparative study for experiments and simulation results was carried out. And the effect of void and pad type on the maximum vibration stress of solder joint was studied. The results showed the relation between deformation of test vehicle and input accelerator represented nonlinear characteristic. The failure of solder joint was occurred firstly in the PBGA which was located on the center of board due to the maximum deformation. The solder joint failure presented the character of solder joint crack, and the crack was initiated at the soldering interface close to solder joint outmost on BGA side and propagated to the internal of solder joint. It can be known that the soldering interface close to SMD pads on BGA side had higher stress concentration and poorer adhesive strength, NSMD solder pad is useful to raise the vibration reliability of solder joint, and maximum stress of solder joint have few sensitive for the changing of solder pad thickness. The phenomenon was validated in the cross-section results. The soldering voids were easy to induce the stress concentration around the voids.
引用
收藏
页码:921 / 924
页数:4
相关论文
共 50 条
  • [31] Reduce risk of vibration-induced pipework failure
    Martin, J. Thomas
    Swindell, Rob J.
    Ballantyne, David
    Lewandowski, Stefan
    Hydrocarbon Processing, 2002, 81 (07): : 57 - 62
  • [32] FUEL ASSEMBLY VIBRATION-INDUCED NEUTRON NOISE IN PWRS
    SWEENEY, FJ
    RENIER, JP
    TRANSACTIONS OF THE AMERICAN NUCLEAR SOCIETY, 1983, 44 : 549 - 550
  • [33] FEA modeling of FCOB assembly solder joint reliability
    Pang, HLJ
    Chong, YR
    MICRO MATERIALS, PROCEEDINGS, 2000, : 159 - 166
  • [34] Study on reliability of PQFP assembly with lead free solder joints under random vibration test
    Che, F. X.
    Pang, John H. L.
    MICROELECTRONICS RELIABILITY, 2015, 55 (12) : 2769 - 2776
  • [35] Usage of SAM on Fatigue Crack of Solder Joint Induced By Thermal Reliability Test
    Chen, Tung Hung
    Shih, T. I.
    ISTFA 2006, 2006, : 228 - 229
  • [36] Reliability and failure analysis of lead-free solder joints for PBGA package under a cyclic bending load
    Kim, Ilho
    Lee, Soon-Bok
    IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 2008, 31 (02): : 478 - 484
  • [37] On the design parameters of flip-chip PBGA package assembly for optimum solder ball reliability
    Verma, K
    Park, SB
    Han, B
    Ackerman, W
    IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 2001, 24 (02): : 300 - 307
  • [38] Assessment of board level solder joint reliability for PBGA assemblies with lead-free solders
    Lee, SWR
    Lui, BHW
    Kong, YH
    Baylon, B
    Leung, T
    Umali, P
    Agtarap, H
    SOLDERING & SURFACE MOUNT TECHNOLOGY, 2002, 14 (03) : 46 - 50
  • [39] Vibration reliability test and finite element analysis for flip chip solder joints
    Che, F. X.
    Pang, John H. L.
    MICROELECTRONICS RELIABILITY, 2009, 49 (07) : 754 - 760
  • [40] Characterization of warpage of flip-chip PBGA package and its effect on solder joint reliability
    Park, S
    Han, B
    Verma, K
    1999 INTERNATIONAL SYMPOSIUM ON MICROELECTRONICS, PROCEEDINGS, 1999, 3906 : 253 - 258