On-line measurement system of virtual dielectric loss based on wavelets and LabVIEW and correlation technics

被引：0
|
作者：
Wang, BB [1 ]
Wang, Y [1 ]
机构：
[1] Xidian Univ, Sch Comp Sci & Engn, Xian 710071, Peoples R China
来源：
COMPUTATIONAL INTELLIGENCE AND SECURITY, PT 1, PROCEEDINGS | 2005年 / 3801卷
关键词：
D O I：
暂无
中图分类号：
TP18 [人工智能理论];
学科分类号：
081104 ; 0812 ; 0835 ; 1405 ;
摘要：
This paper presents the principles and instrument structures of on-line measurement system for dielectric loss of virtual capacitive-type equipment. The system based on wavelets, LabVIEW, GPRS network and SPC correlation technics, which can efficiently solve the problem of eliminating noises from signals, removing the electromagnetism interference to measure the results of influence, global area and full auto on-line measurement, to attain the higher precision of measurement.
引用
收藏
页码：343 / 348
页数：6
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