In situ lift-out with a focused ion beam/scanning electron microscope: A new technique for creating transmission electron microscope samples of natural and synthetic materials - Introduction

被引：0
|
作者：
Zega, TJ [1 ]
Stroud, RM [1 ]
机构：
[1] USN, Res Lab, Washington, DC 20375 USA
来源：
SCANNING | 2006年 / 28卷 / 02期
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D O I：
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中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
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页码：67 / 69
页数：3
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