Fabrication of GaN-based LEDs with 22° undercut sidewalls by inductively coupled plasma reactive ion etching

被引:1
|
作者
Wang Bo [1 ,2 ]
Su Shi-Chen [1 ]
He Miao [1 ]
Chen Hong [2 ]
Wu Wen-Bo [1 ]
Zhang Wei-Wei [1 ]
Wang Qiao [1 ]
Chen Yu-Long [1 ]
Gao You [1 ]
Zhang Li [1 ]
Zhu Ke-Bao [1 ]
Lei Yan [1 ]
机构
[1] S China Normal Univ, Inst Optoelect Mat & Technol, Lab Nanophoton Funct Mat & Devices, Guangzhou 510631, Guangdong, Peoples R China
[2] Chinese Acad Sci, Key Lab Renewable Energy, Beijing Key Lab New Energy Mat & Devices, Beijing Natl Lab Condense Matter Phys,Inst Phys, Beijing 100190, Peoples R China
基金
中国国家自然科学基金; 国家高技术研究发展计划(863计划);
关键词
GaN; light-emitting diode (LED); undercut; LIGHT-EMITTING-DIODES; NITRIDE-BASED LEDS; EXTRACTION;
D O I
10.1088/1674-1056/22/10/106802
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We use a simple and controllable method to fabricate GaN-based light-emitting diodes (LEDs) with 22 degrees undercut sidewalls by the successful implementation of the inductively coupled plasma reactive ion etching (ICP-RIE). Our experiment results show that the output powers of the LEDs with 22 degrees undercut sidewalls are 34.8 mW under a 20-mA current injection, 6.75% higher than 32.6 mW, the output powers of the conventional LEDs under the same current injection.
引用
收藏
页数:4
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