Today's electronics cannot perform in harsh environments (e.g., elevated temperatures and ionizing radiation environments) found in many engineering applications. Based on the coupling between near-field thermal radiation and MEMS thermal actuation, we presented the design and modeling of NanoThermoMechanical AND, OR, and NOT logic gates as an alternative, and showed their ability to be combined into a full thermal adder to perform complex operations. In this work, we introduce the fabrication and characterization of the first ever documented Thermal AND and OR logic gates. The results show thermal logic operations can be achieved successfully through demonstrated and easy-to-manufacture NanoThermoMechanical logic gates.
机构:
Bar Ilan Univ, Fac Engn, IL-5290002 Ramat Gan, Israel
Bar Ilan Univ, Inst Nanotechnol & Adv Mat, IL-5290002 Ramat Gan, IsraelBar Ilan Univ, Fac Engn, IL-5290002 Ramat Gan, Israel