Interfacial stresses in a bi-material assembly with a compliant bonding layer

被引:7
|
作者
Suhir, E. [1 ,3 ,4 ]
Vujosevic, M. [2 ]
机构
[1] Univ Calif Santa Cruz, Santa Cruz, CA 95064 USA
[2] Intel Corp, Folsom, CA USA
[3] Univ Maryland, College Pk, MD 20742 USA
[4] ERS Co, Los Altos, CA USA
关键词
D O I
10.1088/0022-3727/41/11/115504
中图分类号
O59 [应用物理学];
学科分类号
摘要
We examine an elongated bi-material adhesively bonded or soldered assembly with a continuous compliant attachment (bonding layer). The assembly is subjected to external tensile forces or to bending moments applied to one of the assembly components. We develop simple predictive analytical ('mathematical') models for the evaluation of interfacial shearing (in the case of external tensile forces) and peeling (in the case of external bending moments) stresses and strains in the bonding material. The developed models can be helpful in stress-strain analyses of assemblies of the type in question and particularly for printed-circuit-board (PCB)/surface-mounted-device (SMD) assemblies employed in electronic packaging. These models enable one to particularly evaluate the maximum interfacial stresses in the bonding material from the predicted or measured strains in the PCB in the vicinity of but still outside the surface-mounted package.
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页数:9
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