Lateral p-n-p Transistors and Complementary SiC Bipolar Technology

被引:16
|
作者
Lanni, Luigia [1 ]
Malm, Bengt Gunnar [1 ]
Ostling, Mikael [1 ]
Zetterling, Carl-Mikael [1 ]
机构
[1] KTH Royal Inst Technol, Sch Informat & Commun Technol, SE-16440 Kista, Sweden
关键词
Bipolar junction transistor (BJT); silicon carbide (SiC); complementary bipolar; lateral PNP transistor; current gain temperature dependence; high and low temperature; TEMPERATURE; CIRCUITS; PNP;
D O I
10.1109/LED.2014.2303395
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Lateral p-n-p transistors and a complementary bipolar technology have been demonstrated for analog integrated circuits. Besides vertical n-p-n's, this technology provides lateral p-n-p's at the cost of one additional lithographic and dry etching step. Both devices share the same epitaxial layers and feature topside contacts to all terminals. The influence on p-n-p current gain of contact topology (circular versus rectangular), effective base width, base/emitter doping ratio, and temperature was studied in detail. In the range -40 degrees C to 300 degrees C, the current gain of the p-n-p transistor shows a maximum of similar to 37 around 0 degrees C and decreases to similar to 8 at 300 degrees C, whereas in the same range, the gain of n-p-n transistors exhibits a negative temperature coefficient.
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页码:428 / 430
页数:3
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