ab initio quantum chemical methods and calculations;
density functional calculations;
insulating films;
insulating surfaces;
magnesium oxides;
manganese;
metastable impact electron spectroscopy;
oxygen;
photoelectron spectroscopy;
silicon;
D O I:
10.1016/0039-6028(96)00706-6
中图分类号:
O64 [物理化学(理论化学)、化学物理学];
学科分类号:
070304 ;
081704 ;
摘要:
The electronic structures of the surfaces of MgO single crystals, oxidized Mg polycrystals and oxidized Mg films grown by molecular beam epitaxy on Si(100) surfaces were studied using several techniques. These include metastable impact electron spectroscopy (MIES), ultraviolet photoelectron spectroscopy (UPS (He I)), and X-ray photoelectron spectroscopy (XPS). Spectra of oxidized Mg layers on Si(100) show additional features to those obtained for cleaved MgO crystals, These spectral features are attributed to dissociative adsorption of oxygen at bulk oxygen sites. Weak heating of the oxidized Mg layers removes these features and the electronic spectra for all three studied systems become similar. However, the experimental MIES and UPS spectra, both arising mainly from the ionization of the O 2p orbitals, have different structures. They are interpreted on the basis of ab initio Hartree-Fock and density functional calculations of the electronic structures of the ideal MgO(100) surface. It is shown, that the differences in the spectra can be understood by taking into account that UPS spectra reflect the density of electronic states within several surface layers, whereas MIES probes the surface states which are the most extended into the vacuum.
机构:
BAM Fed Inst Mat Res & Testing, Dept 6 5, D-12205 Berlin, Germany
Al Azhar Univ, Fac Sci, Dept Chem, Nasr City, Cairo, EgyptBAM Fed Inst Mat Res & Testing, Dept 6 5, D-12205 Berlin, Germany
Fahmy, Alaa
Mix, Renate
论文数: 0引用数: 0
h-index: 0
机构:
BAM Fed Inst Mat Res & Testing, Dept 6 5, D-12205 Berlin, GermanyBAM Fed Inst Mat Res & Testing, Dept 6 5, D-12205 Berlin, Germany
Mix, Renate
Schoenhals, Andreas
论文数: 0引用数: 0
h-index: 0
机构:
BAM Fed Inst Mat Res & Testing, Dept 6 5, D-12205 Berlin, GermanyBAM Fed Inst Mat Res & Testing, Dept 6 5, D-12205 Berlin, Germany
Schoenhals, Andreas
Friedrich, Joerg
论文数: 0引用数: 0
h-index: 0
机构:
BAM Fed Inst Mat Res & Testing, Dept 6 5, D-12205 Berlin, GermanyBAM Fed Inst Mat Res & Testing, Dept 6 5, D-12205 Berlin, Germany